Basics of Atomic Force Microscopy

Dr. Kathy Walsh, Senior Research Scientist, Illinois Materials Research Laboratory

Atomic force microscopy is a versatile technique for looking at surfaces, an excellent complementary technique to SEM and 3D optical profilometry.  But it's more than just pretty pictures!  AFM can give insight into mechanical, electromagnetic, or chemical properties of a surface, as well as giving highly precise topographic measurements.  This talk will introduce the basics of AFM and will highlight a small number of applications.

As the first webinar in the MRL Webinar Series, this talk introduces AFM at a very basic level.  This webinar took place on 4/2/2020.